"Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies ..."

Olivier Crépel et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.059

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type: Journal Article

metadata version: 2020-02-22

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Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti:
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44(9-11): 1559-1563 (2004)

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