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"Laser diode COFD analysis by thermoreflectance microscopy."

Stefan Dilhaire et al. (2001)

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DOI: 10.1016/S0026-2714(01)00196-2

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - journals/mr/DilhaireGJLSC01
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  - https://dblp.org/rec/journals/mr/DilhaireGJLSC01
Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys:
Laser diode COFD analysis by thermoreflectance microscopy. Microelectron. Reliab. 41(9-10): 1597-1601 (2001)

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