"Improving the ability of Bulk Built-In Current Sensors to detect Single ..."

Jean-Max Dutertre et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.151

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/DutertreBPFRNS14
Jean-Max Dutertre, Rodrigo Possamai Bastos, Olivier Potin, Marie-Lise Flottes, Bruno Rouzeyre, Giorgio Di Natale, Alexandre Sarafianos:
Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS. Microelectron. Reliab. 54(9-10): 2289-2294 (2014)

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