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"Dielectric breakdown distributions for void containing silicon substrates."
R. Falster, F. Bonoli, V. V. Voronkov (2001)
- R. Falster, F. Bonoli, V. V. Voronkov:
Dielectric breakdown distributions for void containing silicon substrates. Microelectron. Reliab. 41(7): 967-971 (2001)
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