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"A comprehensive modeling framework for gate stack process dependence of DC ..."
Nilesh Goel et al. (2014)
- Nilesh Goel
, Kaustubh Joshi
, S. Mukhopadhyay, N. Nanaware, Souvik Mahapatra:
A comprehensive modeling framework for gate stack process dependence of DC and AC NBTI in SiON and HKMG p-MOSFETs. Microelectron. Reliab. 54(3): 491-519 (2014)
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