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"Reverse short channel effects in high-k gated nMOSFETs."

Jin-Ping Han et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.11.049

access: closed

type: Journal Article

metadata version: 2022-11-15

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  - https://dblp.org/rec/journals/mr/HanKVGDRS05
Jin-Ping Han, Sang-Mo Koo, Eric M. Vogel, Evgeni P. Gusev, C. D'Emic, Curt A. Richter, John S. Suehle:
Reverse short channel effects in high-k gated nMOSFETs. Microelectron. Reliab. 45(5-6): 783-785 (2005)

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