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"Performance of nonvolatile memory by using band-engineered ..."
X. D. Huang, Pui-To Lai, Johnny K. O. Sin (2012)
- X. D. Huang, Pui-To Lai, Johnny K. O. Sin:
Performance of nonvolatile memory by using band-engineered SrTiO3/HfON stack as charge-trapping layer. Microelectron. Reliab. 52(11): 2527-2531 (2012)
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