"Electrical degradation and recovery of dielectrics in ..."

Fernanda Irrera (2001)

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DOI: 10.1016/S0026-2714(01)00094-4

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type: Journal Article

metadata version: 2020-02-22

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Fernanda Irrera:
Electrical degradation and recovery of dielectrics in n⁺⁺-poly-Si/SiO_x/SiO₂/p-sub structures designed for application in low-voltage non-volatile memories. Microelectron. Reliab. 41(11): 1809-1813 (2001)

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