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"Experimental Evaluation of Circuit-Based Modeling of the NBTI Effects in ..."

Nebojsa D. Jankovic, Chadwin D. Young (2016)

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DOI: 10.1016/J.MICROREL.2015.12.042

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nebojsa D. Jankovic, Chadwin D. Young:
Experimental Evaluation of Circuit-Based Modeling of the NBTI Effects in Double-Gate FinFETs. Microelectron. Reliab. 59: 26-29 (2016)

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