"Modeling and analysis of single-event transient sensitivity of a ..."

Yuanqing Li et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.05.016

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type: Journal Article

metadata version: 2024-02-05

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Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018)

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