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2020 – today
- 2024
[c33]Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg, Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva:
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. IRPS 2024: 1-7- 2023
- [c32]Hyeongseok Oh, Myungsun Chun, Jiwon Lee, Shi-Jie Wen, Nick Yu, Byung-Gun Park, Sanghyeon Baeg:
Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components. IRPS 2023: 1-6 - 2022
- [c31]Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. IRPS 2022: 7 - [c30]Zhuangwei Kang
, Ayan Mukhopadhyay, Aniruddha Gokhale, Shi-Jie Wen, Abhishek Dubey:
Traffic Anomaly Detection Via Conditional Normalizing Flow. ITSC 2022: 2563-2570 - [i1]Zhuangwei Kang, Ayan Mukhopadhyay, Aniruddha Gokhale, Shi-Jie Wen, Abhishek Dubey:
Generative Anomaly Detection for Time Series Datasets. CoRR abs/2206.14597 (2022) - 2021
- [j20]Donghyuk Yun, Myungsang Park, GeunYong Bak, Sanghyeon Baeg, Shi-Jie Wen:
Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation. IEEE Access 9: 137514-137523 (2021) - [j19]Sanchita Basak, Saptarshi Sengupta, Shi-Jie Wen, Abhishek Dubey:
Spatio-temporal AI inference engine for estimating hard disk reliability. Pervasive Mob. Comput. 70: 101283 (2021) - [c29]Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung:
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. IRPS 2021: 1-5 - 2020
- [c28]Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva:
Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. IRPS 2020: 1-5 - [c27]Dmitry Goloubev, Shi-Jie Wen, Donald Allen, Ranjani Ram, Firdous Bano, Nithin Guruswamy, James Turman:
Use of Silicon-based Sensors for System Reliability Prediction. IRPS 2020: 1-6 - [c26]Andrew M. Keller, Jared Anderson, Michael J. Wirthlin, Shi-Jie Wen, Rita Fung, Conner Chambers:
Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System. IRPS 2020: 1-6 - [c25]Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS 2020: 1-5 - [c24]Lyuan Xu, Jingchen Cao, Shi-Jie Wen, Rita Fung, Jamie Markevitch, Dennis R. Ball, Bharat L. Bhuva:
High-Current State triggered by Operating-Frequency Change. IRPS 2020: 1-4
2010 – 2019
- 2019
- [j18]Somnath Kundu, Muqing Liu, Shi-Jie Wen, Richard Wong, Chris H. Kim:
A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer. IEEE J. Solid State Circuits 54(1): 109-120 (2019) - [c23]Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill:
Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. IRPS 2019: 1-5 - [c22]Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill:
Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. IRPS 2019: 1-5 - 2018
- [j17]Chul Seung Lim, Kyungbae Park, GeunYong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs. Microelectron. Reliab. 80: 85-90 (2018) - [j16]Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018) - [c21]Kurt J. Lezon, Shi-Jie Wen, Y.-F. Dan, Richard Wong, Bharat L. Bhuva:
Single-event effects on optical transceiver. IRPS 2018: 6-1 - [c20]Somnath Kundu, Muqing Liu, Richard Wong, Shi-Jie Wen, Chris H. Kim:
A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning. ISSCC 2018: 308-310 - 2017
- [j15]Hosung Lee, Sanghyeon Baeg, Nelson Hua, Shi-Jie Wen:
Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device. Microelectron. Reliab. 69: 88-99 (2017) - [c19]Yi Luo, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen:
IZIP: In-place zero overhead interconnect protection via PIP redundancy. ASICON 2017: 565-568 - [c18]Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32 - 2016
- [j14]Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg:
Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electron. Express 13(17): 20160627 (2016) - [j13]Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg:
Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]. IEICE Electron. Express 13(19): 20168001 (2016) - 2015
- [j12]Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen:
New insights into the impact of SEUs in FPGA CRAMs. IEICE Electron. Express 12(6): 20150110 (2015) - [c17]GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman:
Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams. IRPS 2015: 3 - [c16]Nihaar N. Mahatme, Bharat L. Bhuva, Nelson J. Gaspard, T. Assis, Y. Xu, P. Marcoux, M. Vilchis, Balaji Narasimham, A. Shih, Shi-Jie Wen, Rick Wong, N. Tam, M. Shroff, S. Koyoma, A. Oates:
Terrestrial SER characterization for nanoscale technologies: A comparative study. IRPS 2015: 4 - [c15]Rui Liu, Adrian Evans, Qiong Wu, Yuanqing Li, Li Chen, Shi-Jie Wen, Rick Wong, Rita Fung:
Analysis of advanced circuits for SET measurement. IRPS 2015: 7 - 2014
- [j11]Yi Ren, Anlin He, Shuting Shi, Gang Guo, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Bharat L. Bhuva:
Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser. J. Electron. Test. 30(1): 149-154 (2014) - [j10]Haibin Wang, Mulong Li, Li Chen, Rui Liu, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Rita Fung, Jinshun Bi:
Single Event Resilient Dynamic Logic Designs. J. Electron. Test. 30(6): 751-761 (2014) - [j9]Jiajia Jiao, Yuzhuo Fu, Shi-Jie Wen:
Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. Microelectron. Reliab. 54(11): 2629-2640 (2014) - [c14]Hao Xie, Li Chen, Rui Liu, Adrian Evans, Dan Alexandrescu, Shi-Jie Wen, Rick Wong:
New approaches for synthesis of redundant combinatorial logic for selective fault tolerance. IOLTS 2014: 62-68 - 2013
- [j8]Zhichao Zhang, Yi Ren, Li Chen, Nelson J. Gaspard, Arthur F. Witulski, W. Timothy Holman, Bharat L. Bhuva, Shi-Jie Wen, Ramaswami Sammynaiken:
A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients. J. Electron. Test. 29(2): 249-253 (2013) - [j7]Yi Ren, Shuting Shi, Li Chen, Haibin Wang, L.-J. Gao, Gang Guo, Shi-Jie Wen, Richard Wong, N. W. van Vonno:
Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller. J. Electron. Test. 29(4): 609-616 (2013) - [j6]Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication. Microprocess. Microsystems 37(8-D): 1103-1107 (2013) - [c13]Richard Wong, Rita Fung, Shi-Jie Wen:
Networking industry trends in ESD protection for high speed IOs. ASICON 2013: 1-4 - [c12]Salvatore Pontarelli, Marco Ottavi, Adrian Evans, Shi-Jie Wen:
Error detection in ternary CAMs using bloom filters. DATE 2013: 1474-1479 - [c11]Michael J. Wirthlin, Joshua E. Jensen, Alex Wilson, William Howes, Shi-Jie Wen, Rick Wong:
Placement of repair circuits for in-field FPGA repair. FPGA 2013: 115-124 - [c10]Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis:
Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops. ISQED 2013: 727-732 - [c9]Hao Xie, Li Chen, Adrian Evans, Shi-Jie Wen, Rick Wong:
Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance. PRDC 2013: 128-129 - 2012
- [j5]Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva:
Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electron. Test. 28(6): 877-883 (2012) - [j4]David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong:
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(8): 1626-1634 (2012) - [c8]Ju-Yueh Lee, Cheng-Ru Chang, Naifeng Jing, Juexiao Su, Shi-Jie Wen, Rick Wong, Lei He:
Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs. FPT 2012: 23-28 - [c7]Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro:
RIIF - Reliability information interchange format. IOLTS 2012: 103-108 - 2011
- [j3]Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong:
Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. IEEE J. Solid State Circuits 46(5): 1100-1110 (2011) - [j2]Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. 16(4): 45:1-45:10 (2011) - [c6]David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong:
Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. CICC 2011: 1-4 - [c5]Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen:
Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. ETS 2011: 202 - [c4]Naifeng Jing, Ju-Yueh Lee, Zhe Feng, Weifeng He, Zhigang Mao, Shi-Jie Wen, Rick Wong, Lei He:
Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms. FPL 2011: 282-285 - [c3]Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED 2011: 390-397 - 2010
- [j1]Sanghyeon Baeg, Shi-Jie Wen, Richard Wong:
Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(4): 814-822 (2010)
2000 – 2009
- 2008
- [c2]Shi-Jie Wen, Dan Alexandrescu, Renaud Perez:
A Systematical Method of Quantifying SEU FIT. IOLTS 2008: 109-114 - [c1]Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong:
Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS 2008: 253-257
Coauthor Index
aka: Rick Wong
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