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"Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA ..."

Wen-Yu Lo, Ming-Dou Ker (2003)

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DOI: 10.1016/S0026-2714(03)00278-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wen-Yu Lo, Ming-Dou Ker:
Analysis and Prevention on NC-ball induced ESD Damages in a 683-Pin BGA Packaged Chipset IC. Microelectron. Reliab. 43(9-11): 1583-1588 (2003)

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