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"Eliminating infant mortality in metallized film capacitors by defect ..."

F. Patrick McCluskey, N. M. Li, Elena Mengotti (2014)

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DOI: 10.1016/J.MICROREL.2014.07.090

access: closed

type: Journal Article

metadata version: 2020-02-22

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F. Patrick McCluskey, N. M. Li, Elena Mengotti:
Eliminating infant mortality in metallized film capacitors by defect detection. Microelectron. Reliab. 54(9-10): 1818-1822 (2014)

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