"Modeling dose effects in electronics devices: Dose and temperature ..."

Alain Michez et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.022

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type: Journal Article

metadata version: 2022-10-02

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Alain Michez, Jerome Boch, S. Dhombres, Frédéric Saigné, Antoine D. Touboul, J.-R. Vaillé, Laurent Dusseau, E. Lorfèvre, R. Ecoffet:
Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. Microelectron. Reliab. 53(9-11): 1306-1310 (2013)

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