"Electron transport through broken down ultra-thin SiO2 layers ..."

Enrique Miranda, Jordi Suñé (2004)

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DOI: 10.1016/J.MICROREL.2003.08.005

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type: Journal Article

metadata version: 2020-02-22

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Enrique Miranda, Jordi Suñé:
Electron transport through broken down ultra-thin SiO₂ layers in MOS devices. Microelectron. Reliab. 44(1): 1-23 (2004)

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