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"Voltage and current stress induced variations in ..."

Durga Misra, Jyothi Kasinath, Arun N. Chandorkar (2013)

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DOI: 10.1016/J.MICROREL.2012.08.020

access: closed

type: Journal Article

metadata version: 2020-02-22

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Durga Misra, Jyothi Kasinath, Arun N. Chandorkar:
Voltage and current stress induced variations in TiN/HfSi_xO_y/TiN MIM capacitors. Microelectron. Reliab. 53(2): 270-273 (2013)

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