"Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM ..."

Helmut Puchner et al. (2001)

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DOI: 10.1016/S0026-2714(01)00207-4

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type: Journal Article

metadata version: 2020-02-22

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Helmut Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti:
Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectron. Reliab. 41(9-10): 1319-1324 (2001)

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