"Low cost and highly reliable radiation hardened latch design in 65 nm CMOS ..."

Chunhua Qi et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.03.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chunhua Qi, Liyi Xiao, Jing Guo, Tianqi Wang:
Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology. Microelectron. Reliab. 55(6): 863-872 (2015)

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