"TCAD investigation on hot-electron injection in new-generation technologies."

Susanna Reggiani et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.097

access: closed

type: Journal Article

metadata version: 2021-03-22

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Susanna Reggiani, Mattia Rossetti, Antonio Gnudi, Andrea Natale Tallarico, Antonio Molfese, Stefano Manzini, Riccardo Depetro, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna:
TCAD investigation on hot-electron injection in new-generation technologies. Microelectron. Reliab. 88-90: 1090-1093 (2018)

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