"Fast and accurate method of lifetime estimation for HfSiON/SiO2 ..."

Giyoun Roh et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.03.035

access: closed

type: Journal Article

metadata version: 2024-09-16

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Giyoun Roh, Hyeokjin Kim, Cheolgyu Kim, Dongwoo Kim, Bongkoo Kang:
Fast and accurate method of lifetime estimation for HfSiON/SiO₂ dielectric n-MOSFETs under positive bias temperature instability. Microelectron. Reliab. 72: 98-102 (2017)

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