"A simplified yield modeling method for design rule trade-off in ..."

Michael Scheffler, Didier Cottet, Gerhard Tröster (2001)

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DOI: 10.1016/S0026-2714(01)00020-8

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type: Journal Article

metadata version: 2020-02-22

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Michael Scheffler, Didier Cottet, Gerhard Tröster:
A simplified yield modeling method for design rule trade-off in interconnection substrates. Microelectron. Reliab. 41(6): 861-869 (2001)

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