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"Destruction failure analysis and international reliability test standard ..."

Takashi Setoya et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.07.042

access: closed

type: Journal Article

metadata version: 2021-10-14

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Takashi Setoya, Tsuneo Ogura, Wataru Saito, Tomoko Matsudai, Koichi Endo:
Destruction failure analysis and international reliability test standard for power devices. Microelectron. Reliab. 55(9-10): 1932-1937 (2015)

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