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"Advanced FIB sample preparation techniques for high resolution TEM ..."
Michél Simon-Najasek et al. (2014)
- Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff:
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures. Microelectron. Reliab. 54(9-10): 1785-1789 (2014)
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