"A new statistical methodology predicting chip failure probability ..."

Ted Sun, Ayhan A. Mutlu, Mahmudur Rahman (2013)

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DOI: 10.1016/J.MICROREL.2013.04.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ted Sun, Ayhan A. Mutlu, Mahmudur Rahman:
A new statistical methodology predicting chip failure probability considering electromigration. Microelectron. Reliab. 53(12): 1979-1986 (2013)

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