"Cross-sectional nanoprobing fault isolation technique on submicron devices."

Pik Kee Tan et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.093

access: closed

type: Journal Article

metadata version: 2024-06-10

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Pik Kee Tan, Huei Hao Yap, Changqing Chen, Francis Rivai, Yuzhe Zhao, Lei Zhu, Hua Feng, Hao Tan, Ran He, D. D. Wang, Y. M. Huang, Yin Zhe Ma, Jeffrey Lam, Zhi Hong Mai:
Cross-sectional nanoprobing fault isolation technique on submicron devices. Microelectron. Reliab. 64: 321-325 (2016)

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