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"OFF-state degradation and correlated gate dielectric breakdown in high ..."

Dhanoop Varghese et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.03.013

access: closed

type: Journal Article

metadata version: 2022-05-09

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Dhanoop Varghese, V. Reddy, S. Krishnan, Muhammad Ashraful Alam:
OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review. Microelectron. Reliab. 54(8): 1477-1488 (2014)

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