"A strategy for characterization and evaluation of ESD robustness of CMOS ..."

Steven H. Voldman et al. (2001)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(00)00236-5

access: closed

type: Journal Article

metadata version: 2020-09-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/VoldmanAACDMW01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/VoldmanAACDMW01
Steven H. Voldman, W. Anderson, R. Ashton, M. Chaine, Charvaka Duvvury, T. Maloney, E. Worley:
A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectron. Reliab. 41(3): 335-348 (2001)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.