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"A strategy for characterization and evaluation of ESD robustness of CMOS ..."

Steven H. Voldman et al. (2001)

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DOI: 10.1016/S0026-2714(00)00236-5

access: closed

type: Journal Article

metadata version: 2020-09-14

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  - https://dblp.org/rec/journals/mr/VoldmanAACDMW01
Steven H. Voldman, W. Anderson, R. Ashton, M. Chaine, Charvaka Duvvury, T. Maloney, E. Worley:
A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectron. Reliab. 41(3): 335-348 (2001)

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