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"Thermal modeling of single event burnout failure in semiconductor power ..."

D. Greg Walker et al. (2001)

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DOI: 10.1016/S0026-2714(00)00249-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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D. Greg Walker, T. S. Fisher, J. Liu, Ronald D. Schrimpf:
Thermal modeling of single event burnout failure in semiconductor power devices. Microelectron. Reliab. 41(4): 571-578 (2001)

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