"A case study of ESD failures at random levels: analysis, explanation and ..."

T. Wu et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.092

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type: Journal Article

metadata version: 2020-02-22

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T. Wu, Theo Smedes, J. P. Lokker, S.-N. Mei, J. W. Slotboom:
A case study of ESD failures at random levels: analysis, explanation and solution. Microelectron. Reliab. 44(9-11): 1823-1827 (2004)

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