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"As-grown-generation (AG) model of NBTI: A shift from fitting test data to ..."

Jianfu Zhang, Zhigang Ji, Wei Dong Zhang (2018)

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DOI: 10.1016/J.MICROREL.2017.11.026

access: closed

type: Journal Article

metadata version: 2022-04-22

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Jianfu Zhang, Zhigang Ji, Wei Dong Zhang:
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction. Microelectron. Reliab. 80: 109-123 (2018)

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