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"A reliability analysis for electronic devices under an extension of ..."
Luis Carlos Méndez González et al. (2023)
- Luis Carlos Méndez González
, Luis Alberto Rodríguez-Picón
, Iván Juan Carlos Pérez Olguín
, Vicente García
, Abel Eduardo Quezada-Carreón
:
A reliability analysis for electronic devices under an extension of exponentiated perks distribution. Qual. Reliab. Eng. Int. 39(3): 776-795 (2023)
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