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ORCIDLuis Alberto Rodríguez-Picón
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2020 – today
- 2023
[j17]Florencio Abraham Roldán-Castellanos, Iván Juan Carlos Pérez Olguín
, Aimeé Gutiérrez-Vázquez, Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón:
Emotional Classification Method (ECW): A Methodology for Measuring Emotional Sustainability in a Work Environment Utilizing Artificial Intelligence. Axioms 12(2): 97 (2023)- [j16]Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Luis Ricardo Vidal Portilla:
An Additive Chen Distribution with Applications to Lifetime Data. Axioms 12(2): 118 (2023) - [j15]Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Vicente García, Abel Eduardo Quezada-Carreón:
A reliability analysis for electronic devices under an extension of exponentiated perks distribution. Qual. Reliab. Eng. Int. 39(3): 776-795 (2023) - [j14]Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín, Jesús Israel Hernández Hernández:
A Gamma Process with Three Sources of Variability. Symmetry 15(1): 162 (2023) - [j13]Juan Vicente Barraza de la Paz, Luis Alberto Rodríguez-Picón, Victor Morales-Rocha, Soledad Vianey Torres-Argüelles:
A Systematic Review of Risk Management Methodologies for Complex Organizations in Industry 4.0 and 5.0. Syst. 11(5): 218 (2023) - 2022
- [j12]Paulo Eduardo García-Nava, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín:
A Study of Stopping Rules in the Steepest Ascent Methodology for the Optimization of a Simulated Process. Axioms 11(10): 514 (2022) - 2021
- [j11]Luis Asunción Pérez Dominguez, David Luviano Cruz, Luis Alberto Rodríguez-Picón, Roberto Romero-López, Karla Yohana Sánchez-Mojica:
Suppliers selection based on intuitionistic fuzzy dimensional analysis. J. Intell. Fuzzy Syst. 40(2): 1805-1815 (2021) - 2020
- [j10]Alejandro Alvarado-Iniesta, Luis Gonzalo Guillen-Anaya, Luis Alberto Rodríguez-Picón, Raul Ñeco-Caberta:
Multi-objective optimization of an engine mount design by means of memetic genetic programming and a local exploration approach. J. Intell. Manuf. 31(1): 19-32 (2020)
2010 – 2019
- 2019
- [j9]Luis Alberto Rodríguez-Picón, Luis Asunción Pérez Dominguez, José Mejía, Iván Jc Pérez-Olguín, Manuel Iván Rodríguez-Borbón:
A Deconvolution Approach for Degradation Modeling With Measurement Error. IEEE Access 7: 143899-143911 (2019) - [j8]Vicente García, J. Salvador Sánchez, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Humberto de Jesús Ochoa Domínguez:
Using regression models for predicting the product quality in a tubing extrusion process. J. Intell. Manuf. 30(6): 2535-2544 (2019) - [j7]Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Alejandro Alvarado-Iniesta, Abel Eduardo Quezada-Carreón:
Reliability analysis using exponentiated Weibull distribution and inverse power law. Qual. Reliab. Eng. Int. 35(4): 1219-1230 (2019) - 2018
- [j6]Luis Asunción Pérez Dominguez, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, David Luviano Cruz, Zeshui Xu:
MOORA under Pythagorean Fuzzy Set for Multiple Criteria Decision Making. Complex. 2018: 2602376:1-2602376:10 (2018) - [j5]Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta:
Degradation modeling based on gamma process models with random effects. Commun. Stat. Simul. Comput. 47(6): 1796-1810 (2018) - 2017
- [j4]Manuel Iván Rodríguez-Borbón, Manuel Arnoldo Rodríguez-Medina, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, Naijun Sha:
Reliability Estimation for Accelerated Life Tests Based on a Cox Proportional Hazard Model with Error Effect. Qual. Reliab. Eng. Int. 33(7): 1407-1416 (2017) - [j3]Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón:
Reliability analysis for electronic devices using beta-Weibull distribution. Qual. Reliab. Eng. Int. 33(8): 2521-2530 (2017) - [j2]Luis Alberto Rodríguez-Picón, Víctor Hugo Flores-Ochoa:
Estimation of a log-linear model for the reliability assessment of products under two stress variables. Int. J. Syst. Assur. Eng. Manag. 8(2s): 1026-1040 (2017) - 2016
- [j1]Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle:
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. Qual. Reliab. Eng. Int. 32(8): 2901-2908 (2016)
Coauthor Index
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last updated on 2023-09-27 22:42 CEST by the dblp team
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