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"Reliability Estimation for Products Subjected to Two-Stage Degradation ..."

Luis Alberto Rodríguez-Picón et al. (2016)

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DOI: 10.1002/QRE.1975

access: closed

type: Journal Article

metadata version: 2020-07-09

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Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle:
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. Qual. Reliab. Eng. Int. 32(8): 2901-2908 (2016)

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