"Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs."

Zaid Al-Ars et al. (2006)

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DOI: 10.1109/TCAD.2006.882492

access: closed

type: Journal Article

metadata version: 2020-09-24

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Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Sultan M. Al-Harbi:
Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(12): 2989-2996 (2006)

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