"Design of built-in test generator circuits using width compression."

Krishnendu Chakrabarty, Brian T. Murray (1998)

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DOI: 10.1109/43.728923

access: closed

type: Journal Article

metadata version: 2022-01-03

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Krishnendu Chakrabarty, Brian T. Murray:
Design of built-in test generator circuits using width compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(10): 1044-1051 (1998)

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