default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDBrian T. Murray
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2000 – 2009
- 2005
[j13]Nagarajan Kandasamy, John P. Hayes, Brian T. Murray:
Dependable communication synthesis for distributed embedded systems. Reliab. Eng. Syst. Saf. 89(1): 81-92 (2005)- [j12]Nagarajan Kandasamy, John P. Hayes, Brian T. Murray:
Time-Constrained Failure Diagnosis in Distributed Embedded Systems: Application to Actuator Diagnosis. IEEE Trans. Parallel Distributed Syst. 16(3): 258-270 (2005) - 2003
- [c11]Rajesh Venkatasubramanian, John P. Hayes, Brian T. Murray:
Low-Cost On-Line Fault Detection Using Control Flow Assertions. IOLTS 2003: 137-143 - [c10]Nagarajan Kandasamy, John P. Hayes, Brian T. Murray:
Dependable Communication Synthesis for Distributed Embedded Systems. SAFECOMP 2003: 275-288 - 2002
- [c9]Nagarajan Kandasamy, John P. Hayes, Brian T. Murray:
Time-Constrained Failure Diagnosis in Distributed Embedded Systems. DSN 2002: 449-458 - 2000
- [j11]Krishnendu Chakrabarty
, Brian T. Murray, Vikram Iyengar:
Deterministic built-in test pattern generation for high-performance circuits using twisted-ring counters. IEEE Trans. Very Large Scale Integr. Syst. 8(5): 633-636 (2000) - [c8]Barbara J. Czerny, Joseph G. D'Ambrosio, Brian T. Murray:
Providing convincing evidence of safety in X-by-wire automotive systems. HASE 2000: 189-192
1990 – 1999
- 1999
- [j10]Vikram Iyengar, Krishnendu Chakrabarty, Brian T. Murray:
Deterministic Built-in Pattern Generation for Sequential Circuits. J. Electron. Test. 15(1-2): 97-114 (1999) - [c7]Nagarajan Kandasamy, John P. Hayes, Brian T. Murray:
Tolerating Transient Faults in Statically Scheduled Safety-Critical Embedded Systems. SRDS 1999: 212-221 - [c6]Krishnendu Chakrabarty, Brian T. Murray, Vikram Iyengar:
Built-in Test Pattern Generation For High-Performance Cir cuits Using Twisted-Ring Counters. VTS 1999: 22-27 - 1998
- [j9]Hussain Al-Asaad, Brian T. Murray, John P. Hayes:
Online BIST for Embedded Systems. IEEE Des. Test Comput. 15(4): 17-24 (1998) - [j8]Hussain Al-Asaad, John P. Hayes, Brian T. Murray:
Scalable Test Generators for High-Speed Datapath Circuits. J. Electron. Test. 12(1-2): 111-125 (1998) - [j7]Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes:
Optimal Zero-Aliasing Space Compaction of Test Responses. IEEE Trans. Computers 47(11): 1171-1187 (1998) - [j6]Krishnendu Chakrabarty, Brian T. Murray:
Design of built-in test generator circuits using width compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(10): 1044-1051 (1998) - [j5]Vikram Iyengar, Krishnendu Chakrabarty, Brian T. Murray:
Huffman encoding of test sets for sequential circuits. IEEE Trans. Instrum. Meas. 47(1): 21-25 (1998) - [c5]Vikram Iyengar, Krishnendu Chakrabarty, Brian T. Murray:
Built-In Self Testing of Sequential Circuits Using Precomputed Test Sets. VTS 1998: 418-423 - 1997
- [c4]Krishnendu Chakrabarty, Jian Liu, Minyao Zhu, Brian T. Murray:
Test Width Compression for Built-In Self Testing. ITC 1997: 328-337 - 1996
- [j4]Brian T. Murray, John P. Hayes:
Testing ICs: Getting to the Core of the Problem. Computer 29(11): 32-38 (1996) - 1995
- [c3]Krishnendu Chakrabarty, Brian T. Murray, John P. Hayes:
Optimal Space Compaction of Test Responses. ITC 1995: 834-843 - 1994
- [b1]Brian T. Murray:
Hierarchical testing using precomputed tests for modules. University of Michigan, USA, 1994 - [j3]Xiaobo Hu, Joseph G. D'Ambrosio, Brian T. Murray, Dah-Lain Tang:
Codesign of architectures for automotive powertrain modules. IEEE Micro 14(4): 17-25 (1994) - 1991
- [c2]Brian T. Murray, John P. Hayes:
Test Propagation Through Modules and Circuits. ITC 1991: 748-757 - 1990
- [j2]Brian T. Murray, John P. Hayes:
Hierarchical test generation using precomputed tests for modules. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(6): 594-603 (1990)
1980 – 1989
- 1989
- [j1]Debashis Bhattacharya, Brian T. Murray, John P. Hayes:
High-Level Test Generation for VLSI. Computer 22(4): 16-24 (1989) - 1988
- [c1]Brian T. Murray, John P. Hayes:
Hierarchical Test Generation Using Precomputed Tests for Modules. ITC 1988: 221-229
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:42 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
