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"Toward massively parallel automatic test generation."

Srimat T. Chakradhar, Michael L. Bushnell, Vishwani D. Agrawal (1990)

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DOI: 10.1109/43.59074

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/ChakradharBA90
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  - https://dblp.org/rec/journals/tcad/ChakradharBA90
Srimat T. Chakradhar, Michael L. Bushnell, Vishwani D. Agrawal:
Toward massively parallel automatic test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(9): 981-994 (1990)

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