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ORCIDIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 9
Volume 9, Number 1, January 1990
- Chin-Long Wey, Tsin-Yuan Chang:
An efficient output phase assignment for PLA minimization. 1-7 - Srinivas Devadas, Hi-Keung Tony Ma, A. Richard Newton, Alberto L. Sangiovanni-Vincentelli
:
Irredundant sequential machines via optimal logic synthesis. 8-18 - Prathima Agrawal, William J. Dally:
A hardware logic simulation system. 19-29 - David M. Lewis:
Device model approximation using 2N trees. 30-38 - Sanae Fukuda, Naoyuki Shigyo, Koichi Kato, Shin Nakamura:
A ULSI 2-D capacitance simulator for complex structures based on actual processes. 39-47 - Taoyun Wang, Joseph R. Mautz, Roger F. Harrington:
The excess capacitance of a microstrip via in a dielectric substrate. 48-56 - Adam D. Sherer, Bob S. Stanojevich, Robert J. Bowman:
SMALS: a novel database for two-dimensional object location. 57-65 - David Marple, Michiel Smulders, Henk Hegen:
Tailor: a layout system based on trapezoidal corner stitching. 66-90 - Youssef Saab, Vasant B. Rao:
Fast effective heuristics for the graph bisectioning problem. 91-98 - Karem A. Sakallah, Yao-Tsung Yen, Steve S. Greenberg:
A first-order charge conserving MOS capacitance model. 99-108
Volume 9, Number 2, February 1990
- Han Young Koh, Carlo H. Séquin, Paul R. Gray:
OPASYN: a compiler for CMOS operational amplifiers. 113-125 - Don Stark, Mark Horowitz:
Techniques for calculating currents and voltages in VLSI power supply networks. 126-132 - Genhong Ruan, Jirí Vlach, James A. Barby:
Logic simulation with current-limited switches. 133-141 - Gregory T. Brauns, R. J. Bishop, Michael Steer, John J. Paulos, Sasan H. Ardalan:
Table-based modeling of delta-sigma modulators using ZSIM. 142-150 - Youn-Long Lin, Yu-Chin Hsu, Fur-Shing Tsai:
Hybrid routing. 151-157 - Kurt Mehlhorn, Stefan Näher:
A faster compaction algorithm with automatic jog insertion. 158-166 - Hyunchul Shin, Alberto L. Sangiovanni-Vincentelli, Carlo H. Séquin:
'Zone-refining' techniques for IC layout compaction. 167-179 - Michael Kaufmann:
A linear-time algorithm for routing in a convex grid. 180-184 - Jan-Ming Ho, Gopalakrishnan Vijayan, Chak-Kuen Wong:
New algorithms for the rectilinear Steiner tree problem. 185-193 - Ronald F. Ayres:
Completely automatic completion of VLSI designs. 194-202 - Sunggu Lee, Kang G. Shin:
Design for test using partial parallel scan. 203-211 - Fadi Maamari, Janusz Rajski:
A method of fault simulation based on stem regions. 212-220
Volume 9, Number 3, March 1990
- Makiko Okumura, Tsutomu Sugawara, Hiroshi Tanimoto:
An efficient small signal frequency analysis method of nonlinear circuits with two frequency excitations. 225-235 - Bernhard Hoppe, Gerd Neuendorf, Doris Schmitt-Landsiedel, J. Will Specks:
Optimization of high-speed CMOS logic circuits with analytical models for signal delay, chip area, and dynamic power dissipation. 236-247 - Wim De Pauw, Ludo Weyten:
Multiple storage adaptive multi-trees. 248-252 - Jonathan Rose, Wolfgang Klebsch, Jürgen Wolf:
Temperature measurement and equilibrium dynamics of simulated annealing placements. 253-259 - John Valainis, Sinan Kaptanoglu, Erwin Liu, Roberto Suaya:
Two-dimensional IC layout compaction based on topological design rule checking. 260-275 - Razali Ismail, Gehan A. J. Amaratunga:
Adaptive meshing schemes for simulating dopant diffusion. 276-289 - W. Scott Stornetta, Bernardo A. Huberman, Tad Hogg:
Scaling theory for fault stealing algorithms in large systolic arrays. 290-298 - Vijay S. Iyengar, Barry K. Rosen, John A. Waicukauski:
On computing the sizes of detected delay faults. 299-312 - Srinivas Patil, Prithviraj Banerjee:
A parallel branch and bound algorithm for test generation. 313-322 - Wei-Kang Huang, Yinan N. Shen, Fabrizio Lombardi:
New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement. 323-328 - Sreejit Chakravarty, S. S. Ravi:
Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits. 329-331 - Niraj K. Jha:
Strong fault-secure and strongly self-checking domino-CMOS implementations of totally self-checking circuits. 332-336
Volume 9, Number 4, April 1990
- Daniel Weise:
Multilevel verification of MOS circuits. 341-351 - Lawrence T. Pillage, Ronald A. Rohrer:
Asymptotic waveform evaluation for timing analysis. 352-366 - An-Chang Deng, Yan-Chyuan Shiau:
Generic linear RC delay modeling for digital CMOS circuits. 367-376 - San-Yuan Wu, Sartaj Sahni:
Covering rectilinear polygons by rectangles. 377-388 - Kurt Mehlhorn, Wolfgang Rülling:
Compaction on the torus [VLSI layout]. 389-397 - James P. Cohoon, Dana S. Richards, Jeffrey S. Salowe:
An optimal Steiner tree algorithm for a net whose terminals lie on the perimeter of a rectangle. 398-407 - Jason Cong, C. L. Liu:
Over-the-cell channel routing. 408-418 - Jan-Ming Ho, Majid Sarrafzadeh, Gopalakrishnan Vijayan, Chak-Kuen Wong:
Pad minimization for planar routing of multiple power nets. 419-426 - Kazuhiko Iwasaki, Fumio Arakawa:
An analysis of the aliasing probability of multiple-input signature registers in the case of a 2m-ary symmetric channel. 427-438 - Farid N. Najm, Richard Burch, Ping Yang, Ibrahim N. Hajj:
Probabilistic simulation for reliability analysis of CMOS VLSI circuits. 439-450
Volume 9, Number 5, May 1990
- Christos A. Papachristou, Anil L. Pandya:
A design scheme for PLA-based control tables with reduced area and time-delay cost. 453-472 - Philip A. Wilsey, Subrata Dasgupta:
A formal model of computer architectures for digital system design environments. 473-486 - Kiyotaka Yamamura, Kazuo Horiuchi:
A globally and quadratically convergent algorithm for solving nonlinear resistive networks. 487-499 - Khushro Shahookar, Pinaki Mazumder:
A genetic approach to standard cell placement using meta-genetic parameter optimization. 500-511 - Wing Ning Li, Sartaj Sahni:
Pull up transistor folding. 512-521 - Pei-Yung Hsiao, Wu-Shiung Feng:
Using a multiple storage quad tree on a hierarchical VLSI compaction scheme. 522-536 - Paul Molitor:
Constrained via minimization for systolic arrays. 537-542 - Ernst Rank, Ulrich Weinert:
A simulation system for diffusive oxidation of silicon: a two-dimensional finite element approach. 543-550 - Anthony E. Parker, David J. Skellern:
An improved FET model for computer simulators. 551-553 - Navneet K. Jain, V. C. Prasad, A. B. Bhattacharyya:
Delay time sensitivity in nonlinear monotone RC trees. 554-560
Volume 9, Number 6, June 1990
- Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff:
Testability analysis of analog systems. 573-583 - Hans-Joachim Wunderlich:
Multiple distributions for biased random test patterns. 584-593 - Rob Dekker, Frans P. M. Beenker, Loek Thijssen:
A realistic fault model and test algorithms for static random access memories. 567-572 - Brian T. Murray, John P. Hayes:
Hierarchical test generation using precomputed tests for modules. 594-603 - Srinivas Devadas, Hi-Keung Tony Ma:
Easily testable PLA-based finite state machines. 604-611 - Bulent I. Dervisoglu:
Application of scan hardware and software for debug and diagnostics in a workstation environment. 612-620 - Stephen R. Demba, Ernst G. Ulrich, Karen Panetta Lentz, David Giramma:
Experiences with concurrent fault simulation of diagnostic programs. 621-628 - Kent D. Wilken, John Paul Shen:
Continuous signature monitoring: low-cost concurrent detection of processor control errors. 629-641 - S. Chowdhury, Javed Sabir Barkatullah:
Estimation of maximum currents in MOS IC logic circuits. 642-654 - Duncan M. Hank Walker, D. S. Nydick:
DVLASIC: catastrophic fault yield simulation in a distributed processing environment. 655-664 - D. Y. Cheng, J. T. Deutsch, Robert W. Dutton:
'Defensive programming' in the rapid development of a parallel scientific program. 665-669 - Joel W. Gannett:
SHORTFINDER: a graphical CAD tool for locating net-to-net shorts in VLSI chip layouts. 669-674
Volume 9, Number 7, July 1990
- W. T. Liou, Jimmy J. M. Tan, Richard C. T. Lee:
Minimum rectangular partition problem for simple rectilinear polygons. 720-733 - Michael D. Osterman, Michael G. Pecht:
Placement for reliability and routability of convectively cooled PWBs. 734-744 - Chi-Yi Hwang, Yung-Chin Hsieh, Youn-Long Lin, Yu-Chin Hsu:
A fast transistor-chaining algorithm for CMOS cell layout. 781-786 - Forrest Brewer, Daniel D. Gajski:
Chippe: a system for constraint driven behavioral synthesis. 681-695 - Prathima Agrawal, Scott H. Robinson, Thomas G. Szymanski:
Automatic modeling of switch-level networks using partial orders [MOS circuits]. 696-707 - Robert L. Maziasz, John P. Hayes:
Layout optimization of static CMOS functional cells. 708-719 - Shintaro Ushio, Kenji Nishi, Shigeki Kuroda, Kazuhiko Kai, Jun Ueda:
A fast three-dimensional process simulator OPUS/3D with access to two-dimensional simulation results. 745-751 - Debashis Bhattacharya, John P. Hayes:
Designing for high-level test generation. 752-766 - Micaela Serra, Terry Slater, Jon C. Muzio, D. Michael Miller:
The analysis of one-dimensional linear cellular automata and their aliasing properties. 767-778 - Doron Drusinsky-Yoresh:
Symbolic cover minimization of fully I/O specified finite state machines. 779-781 - Nripendra N. Biswas:
On covering distant minterms by the camp algorithm. 786-789
Volume 9, Number 8, August 1990
- Shiu-Kai Chin, Edward P. Stabler:
Synthesis of arithmetic hardware using hardware metafunctions. 793-803 - Nam Ling, Magdy A. Bayoumi:
Systolic temporal arithmetic: a new formalism for specification and verification of systolic arrays. 804-820 - Matthias Passlack, Manfred Uhle, Horst Elschner:
Analysis of propagation delays in high-speed VLSI circuits using a distributed line model. 821-826 - Pierre Roussel-Ragot, Gérard Dreyfus:
A problem independent parallel implementation of simulated annealing: models and experiments. 827-835 - Yu Hen Hu, Sao-Jie Chen:
GM Plan: a gate matrix layout algorithm based on artificial intelligence planning techniques. 836-845 - Clifford D. Maldonado, Ross A. Williams:
A transient analytical model for predicting the redistribution of injected interstitials. 846-855 - Martin Thurner, Siegfried Selberherr:
Three-dimensional effects due to the field oxide in MOS devices analyzed with MINIMOS 5. 856-867 - Nagisa Ishiura, Masayuki Ito, Shuzo Yajima:
Dynamic two-dimensional parallel simulation technique for high-speed fault simulation on a vector processor. 868-875 - Michael Demjanenko, Shambhu J. Upadhyaya:
Yield enhancement of field programmable logic arrays by inherent component redundancy. 876-884 - Hideo Fujiwara, Tomoo Inoue:
Optimal granularity of test generation in a distributed system. 885-892 - Weiwei Mao, Michael D. Ciletti:
DYTEST: a self-learning algorithm using dynamic testability measures to accelerate test generation. 893-898 - Pak K. Chan, Kevin Karplus:
Computing signal delay in general RC networks by tree/link partitioning. 898-902
Volume 9, Number 9, September 1990
- Tiziano Villa, Alberto L. Sangiovanni-Vincentelli:
NOVA: state assignment of finite state machines for optimal two-level logic implementation. 905-924 - Gert Goossens, Jan M. Rabaey, Joos Vandewalle, Hugo De Man:
An efficient microcode compiler for application specific DSP processors. 925-937 - Michael C. McFarland, Thaddeus J. Kowalski:
Incorporating bottom-up design into hardware synthesis. 938-950 - Resve A. Saleh, Jacob K. White:
Accelerating relaxation algorithms for circuit simulation using waveform-Newton and step-size refinement. 951-958 - Bill Lin, A. Richard Newton:
A circuit disassembly technique for synthesizing symbolic layouts from mask descriptions. 959-969 - Matthias F. M. Stallmann, Thomas A. Hughes, Wentai Liu:
Unconstrained via minimization for topological multilayer routing. 970-980 - Srimat T. Chakradhar, Michael L. Bushnell, Vishwani D. Agrawal:
Toward massively parallel automatic test generation. 981-994 - Farid N. Najm, Ibrahim N. Hajj:
The complexity of fault detection in MOS VLSI circuits. 995-1001 - Chung-Yu Wu, Ming-Chuen Shiau:
Efficient physical timing models for CMOS AND-OR-inverter and OR-AND-inverter gates and their applications. 1002-1009 - F. Joel Ferguson:
Detection of multiple faults in MOS circuits. 1009-1014
Volume 9, Number 10, October 1990
- TingTing Hwang, Robert Michael Owens, Mary Jane Irwin:
Exploiting communication complexity for multilevel logic synthesis. 1017-1027 - Asim J. Al-Khalili, Yong Zhu, Dhamin Al-Khalili:
A module generator for optimized CMOS buffers. 1028-1046 - Evangelos Simoudis:
Learning redesign knowledge circuit redesign. 1047-1062 - Patrick Odent, Luc J. M. Claesen, Hugo De Man:
Acceleration of relaxation-based circuit simulation using a multiprocessor system. 1063-1072 - Jonathan Rose:
Parallel global routing for standard cells. 1085-1095 - Raja Venkateswaran, Pinaki Mazumder:
A hexagonal array machine for multilayer wire routing. 1096-1112 - E. Rorris, R. R. O'Brien, F. F. Morehead, R. F. Lever, J. P. Peng, G. R. Srinivasan:
A new approach to the simulation of the coupled point defects and impurity diffusion. 1113-1122 - Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee:
A universal MOSFET mobility degradation model for circuit simulation. 1123-1126 - Jacques Benkoski, E. Vanden Meersch, Luc J. M. Claesen, Hugo De Man:
Timing verification using statically sensitizable paths. 10723-10784
Volume 9, Number 11, November 1990
- Dietmar Schroeder:
Three-dimensional nonequilibrium interface conditions for electron transport at band edge discontinuities. 1136-1140 - Gerhard K. M. Wachutka:
Rigorous thermodynamic treatment of heat generation and conduction in semiconductor device modeling. 1141-1149 - Tarek Shawki, Georges Salmer, Osman El-Sayed:
2-D simulation of degenerate hot electron transport in MODFETs including DX center trapping. 1150-1163 - Paolo Lugli:
The Monte Carlo method for semiconductor device and process modeling. 1164-1176 - Kenji Taniguchi, Yoshiaki Shibata, Chihiro Hamaguchi:
Process modeling and simulation: boundary conditions for point defect-based impurity diffusion model. 1177-1183 - Wolfgang Bergner, Roland Kircher:
SITAR-an efficient 3-D simulator for optimization of nonplanar trench structures. 1184-1188 - Martin Thurner, Philipp Lindorfer, Siegfried Selberherr:
Numerical treatment of nonrectangular field-oxide for 3-D MOSFET simulation. 1189-1197 - Arokia Nathan, Henry Baltes, Walter Allegretto:
Review of physical models for numerical simulation of semiconductor microsensors. 1198-1208 - Peter Lloyd, Heinz K. Dirks, E. James Prendergast, Kishore Singhal:
Technology CAD for competitive products. 1209-1216 - Chiaki Takano, Zhiping Yu, Robert W. Dutton:
A nonequilibrium one-dimensional quantum-mechanical simulation for AlGaAs/GaAs HEMT structures. 1217-1224 - Valery Axelrad:
Fourier method modeling of semiconductor devices. 1225-1237 - Yue-Sun Kuo:
Representing large cell maps. 1238-1241
Volume 9, Number 12, December 1990
- Wing Ning Li, Sudhakar M. Reddy, Sartaj Sahni:
Long and short covering edges in combination logic circuits. 1245-1253 - Angelo Brambilla, Enrico Dallago:
A circuit-level simulation model of PNPN devices. 1254-1264 - Jih-Shyr Yih, Pinaki Mazumder:
A neural network design for circuit partitioning. 1265-1271 - Jan-Ming Ho, Majid Sarrafzadeh, Gopalakrishnan Vijayan, Chak-Kuen Wong:
Layer assignment for multichip modules. 1272-1277 - Patrick Groeneveld:
A multiple layer contour-based gridless channel router. 1278-1288 - Godfried M. Swinkels, Louis J. Hafer:
Schematic generation with an expert system. 1289-1306 - Pierre-François Dubois, Alain Puissochet, Anne-Marie Tagant:
A general and flexible switchbox router: CARIOCA. 1307-1317 - Charles C. Chiang, Majid Sarrafzadeh, Chak-Kuen Wong:
Global routing based on Steiner min-max trees. 1318-1325 - Gopalakrishnan Vijayan:
Partitioning logic on graph structures to minimize routing cost. 1326-1334 - Gabriel M. Silberman, Ilan Y. Spillinger:
Using functional fault simulation and the difference fault model to estimate implementation fault coverage. 1335-1343 - Maurizio Damiani, Piero Olivo, Michele Favalli, Silvia Ercolani, Bruno Riccò:
Aliasing in signature analysis testing with multiple input shift registers. 1344-1353 - Richard Booth, Marvin White:
Simulation of a MOS transistor with spatially nonuniform channel parameters. 1354-1357
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