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"Computing optimal test sequences from complete test sets for stuck-open ..."

Sreejit Chakravarty, S. S. Ravi (1990)

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DOI: 10.1109/43.46808

access: closed

type: Journal Article

metadata version: 2020-09-24

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Sreejit Chakravarty, S. S. Ravi:
Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(3): 329-331 (1990)

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