"C-Testing and Efficient Fault Localization for AI Accelerators."

Arjun Chaudhuri et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TCAD.2021.3107401

access: closed

type: Journal Article

metadata version: 2022-06-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/ChaudhuriLFC22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/ChaudhuriLFC22
Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty:
C-Testing and Efficient Fault Localization for AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2348-2361 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.