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Xiaoxin Fan
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2020 – today
- 2022
- [j1]Arjun Chaudhuri
, Chunsheng Liu, Xiaoxin Fan
, Krishnendu Chakrabarty
:
C-Testing and Efficient Fault Localization for AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2348-2361 (2022) - 2020
- [c10]Arjun Chaudhuri, Chunsheng Liu, Xiaoxin Fan, Krishnendu Chakrabarty
:
C-Testing of AI Accelerators *. ATS 2020: 1-6
2010 – 2019
- 2013
- [c9]Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy:
Distributed dynamic partitioning based diagnosis of scan chain. VTS 2013: 1-6 - 2012
- [c8]Xiaoxin Fan, Manish Sharma, Wu-Tung Cheng, Sudhakar M. Reddy:
Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns. Asian Test Symposium 2012: 7-12 - [c7]Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware:
Improved volume diagnosis throughput using dynamic design partitioning. ITC 2012: 1-10 - 2011
- [c6]Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware:
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225 - [c5]Xiaoxin Fan, Sudhakar M. Reddy, Irith Pomeranz:
Max-Fill: A method to generate high quality delay tests. DDECS 2011: 375-380 - [c4]Xiaoxin Fan, Sudhakar M. Reddy, Senling Wang, Seiji Kajihara, Yasuo Sato:
Genetic algorithm based approach for segmented testing. DSN Workshops 2011: 85-90
2000 – 2009
- 2008
- [c3]Yu Hu, Xiang Fu, Xiaoxin Fan, Hideo Fujiwara:
Localized random access scan: Towards low area and routing overhead. ASP-DAC 2008: 565-570 - 2007
- [c2]Xiaoxin Fan, Yu Hu, Laung-Terng Wang:
An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing. ATS 2007: 341-348 - [c1]Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li:
The design-for-testability features of a general purpose microprocessor. ITC 2007: 1-9
Coauthor Index
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