"On Trace Buffer Reuse-Based Trigger Generation in Post-Silicon Debug."

Yun Cheng et al. (2018)

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DOI: 10.1109/TCAD.2017.2778084

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type: Journal Article

metadata version: 2025-10-14

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Yun Cheng, Huawei Li, Ying Wang, Haihua Shen, Bo Liu, Xiaowei Li:
On Trace Buffer Reuse-Based Trigger Generation in Post-Silicon Debug. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2166-2179 (2018)

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