"PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse ..."

Seokjun Jang et al. (2025)

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DOI: 10.1109/TCAD.2024.3429071

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type: Journal Article

metadata version: 2025-01-25

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Seokjun Jang, Youngki Moon, Duyeon Won, Sungho Kang:
PASS: Pattern-Sequence-Authentication-Based Secure Scan Against Reverse Engineering Attacks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(1): 52-64 (2025)

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