"Combinational automatic test pattern generation for acyclic sequential ..."

Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja (2005)

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DOI: 10.1109/TCAD.2005.847894

access: closed

type: Journal Article

metadata version: 2020-09-24

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Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja:
Combinational automatic test pattern generation for acyclic sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(6): 948-956 (2005)

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