"Efficient test solutions for core-based designs."

Erik Larsson et al. (2004)

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DOI: 10.1109/TCAD.2004.826560

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type: Journal Article

metadata version: 2025-05-01

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Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng:
Efficient test solutions for core-based designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(5): 758-775 (2004)

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