"Transparent-Test Methodologies for Random Access Memories Without/With ECC."

Jin-Fu Li (2007)

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DOI: 10.1109/TCAD.2007.895772

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type: Journal Article

metadata version: 2023-10-17

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Jin-Fu Li:
Transparent-Test Methodologies for Random Access Memories Without/With ECC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(10): 1888-1893 (2007)

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