"A Model-Based-Random-Forest Framework for Predicting Vt Mean ..."

Chien-Hsueh Lin et al. (2018)

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DOI: 10.1109/TCAD.2017.2783304

access: closed

type: Journal Article

metadata version: 2020-09-24

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Chien-Hsueh Lin, Chih-Ying Tsai, Kao-Chi Lee, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao:
A Model-Based-Random-Forest Framework for Predicting V_t Mean and Variance Based on Parallel I_d Measurement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2139-2151 (2018)

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