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"Capturing Post-Silicon Variations Using a Representative Critical Path."

Qunzeng Liu, Sachin S. Sapatnekar (2010)

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DOI: 10.1109/TCAD.2009.2035552

access: closed

type: Journal Article

metadata version: 2020-09-24

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Qunzeng Liu, Sachin S. Sapatnekar:
Capturing Post-Silicon Variations Using a Representative Critical Path. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(2): 211-222 (2010)

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