"From Virtual Characterization to Test-Chips: DFM Analysis Through Pattern ..."

Mayler G. A. Martins et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TCAD.2018.2889772

access: closed

type: Journal Article

metadata version: 2025-03-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/MartinsPIP20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/MartinsPIP20
Mayler G. A. Martins, Samuel N. Pagliarini, Mehmet Meric Isgenc, Lawrence T. Pileggi:
From Virtual Characterization to Test-Chips: DFM Analysis Through Pattern Enumeration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(2): 520-532 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.