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"From Virtual Characterization to Test-Chips: DFM Analysis Through Pattern ..."

Mayler G. A. Martins et al. (2020)

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DOI: 10.1109/TCAD.2018.2889772

access: closed

type: Journal Article

metadata version: 2020-09-24

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Mayler G. A. Martins, Samuel N. Pagliarini, Mehmet Meric Isgenc, Lawrence T. Pileggi:
From Virtual Characterization to Test-Chips: DFM Analysis Through Pattern Enumeration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(2): 520-532 (2020)

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