"Test compaction for sequential circuits."

Thomas M. Niermann et al. (1992)

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DOI: 10.1109/43.124404

access: closed

type: Journal Article

metadata version: 2020-09-24

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Thomas M. Niermann, Rabindra K. Roy, Janak H. Patel, Jacob A. Abraham:
Test compaction for sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(2): 260-267 (1992)

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